LUMINA INSTRUMENTS INC.
Nano-particle inspection system for defects on glass semiconductor packaging substrates ≥300 mm
- Sector
- Semiconductors
- Total capital
- $756K
- Federal grants
- $756K
- 2 awards · 2021–2024
- Rank in peer group#14 of 36
- Private capital raised
- None on recordNo Form D filings on SEC EDGAR. Some raises are not filed.
- Federal contracts
- None on recordNo federal contract awards found.
- Granted patents
- 9
- 3 pending · first 2020
- Rank in peer group#3 of 36
Capital timeline
Latest events
- Federal grantNSF · Phase II · SBIR Phase II: Innovative Glass Inspection for Advanced Semiconductor Packaging$500K
- Federal grantNSF · Phase I · SBIR Phase I: Full surface angstrom-level contamination and defect detection on thin glass samples$256K
Node area is scaled to amount. Form D reports securities sold, which can differ from an announced round; filings are numbered in the order they were made.
Standing among 36 peers
Line = medianSemiconductors · Instrument
- Federal grants#14 · top 39%
- Granted patents#3 · top 8%
Cumulative measures favor older companies. Rankings describe position today, not outcome. Below the median, ranks show as a band rather than a number.
Founders and team
No founders are linked to this company yet.
Founders appear once a person is matched to the company through its own patents, grants or filings. We never infer people from social profiles.
Checked: USPTO inventors; federal award principal investigators; SEC Form D related persons · Oct 23, 2026
Claim this profile to add your teamWhat it has protected
USPTO · 9 granted of 12- PendingDual Scan Beam Separation With Independent Angle Of Incidence Defect Scanner And Optical InspectorUSPTOApplication 18520279
- GrantedSlope, P-component And S-component MeasurementUSPTOUS 12,146,830
- GrantedSurface Contour MeasurementUSPTOUS 12,146,732
Show all 12 patent records
- Dual Scan Beam Separation With Independent Angle Of Incidence Defect Scanner And Optical InspectorMar 20, 2025 · Application 18520279Pending
- Slope, P-component And S-component MeasurementNov 19, 2024 · US 12,146,830Granted
- Surface Contour MeasurementNov 19, 2024 · US 12,146,732Granted
- Scanning Micro ProfilerNov 19, 2024 · US 12,147,033Granted
- Time Domain Multiplexed Defect ScannerDec 26, 2023 · US 11,852,592Granted
- Time Domain Multiplexed Defect ScannerAug 22, 2023 · US 11,733,173Granted
- Region Prober Optical InspectorFeb 22, 2022 · US 11,255,796Granted
- Scattered Radiation Defect Depth DetectionSep 8, 2020 · US 10,767,977Granted
- Scattered Radiation Optical ScannerMay 12, 2020 · US 10,648,928Granted
- Phase Retardance Optical ScannerMay 5, 2020 · US 10,641,713Granted
- Time Domain Multiplexed Defect ScannerApplication 18092385Pending
- Dual Scan Beam Separation With Independent Angle Of Incidence Defect Scanner And Optical InspectorApplication PCTUS2024057486Pending
Related companies, and why
- LUMINA INSTRUMENTS INCShares a founder: Steven Meeks
- NimbeLink Corp.Similar federal contract value in Semiconductors · null in contracts
- Terecircuits CorporationSimilar federal contract value in Semiconductors · null in contracts
- NEWPATH RESEARCH LLCSimilar federal contract value in Semiconductors · null in contracts
- MuMEC, Inc.Similar federal contract value in Semiconductors · null in contracts
- INVIS TechnologiesSimilar federal contract value in Semiconductors · null in contracts
Sources
Federal grants from SBIR/STTR, NIH, NSF and DoD records. Federal contracts from USAspending.gov. Private capital from SEC Form D. Patents from USPTO. Publications from OpenAlex. Regulatory activity from the Federal Register. Press matched on company name.
How to read this page
Figures show associations in public records, not causes or predictions. Nothing here is investment advice. An em-dash means no record was found under this company's name, not that none exists.
Data freshness
SEC Form D filings through . SBIR and STTR awards through .