Checkpoint Technologies LLC

San Jose, CA · Semiconductors · Private

Thru-Lens Fiducial Marking system integrated into IR microscopes for creating reference marks on silicon wafer backsides during semiconductor device analysis

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Updated Oct 23, 2026 · checkpointtechnologies.com

Sector: Semiconductors
Headquarters: San Jose, CA
Total capital: $7M

Federal grants: $875K; 2 awards · 2018–2019; Rank in peer group#5 of 49
Private capital raised: None on recordNo Form D filings on SEC EDGAR. Some raises are not filed.
Federal contracts: $6.2M; 16 awards · Defense, Justice; Rank in Semiconductors#50 of 707
Granted patents: 7; 3 pending · first 2014; Rank in peer group#7 of 49

Capital timeline

Latest events

Jul 2025Federal contractDefense · Vlsom Maintenance Infrascan ES400C-LW, Ltm-sannual Coverage For Infrascan ES400C-LW, Ltm-s, S/n 4226$221K
Jun 2025Federal contractJustice · System Controller With Windows 11, Plus Proscan Software For The Infrascan 400 Tdm.$35K
Aug 2024Federal contractDefense · Annual Coverage For Infrascan ES400C-LW$213K
Aug 2023Federal contractJustice · De-install, Ship, And Re-install Equipment$44K
Sep 2019Federal grantDefense · Phase II · Through-Lens Fiducial Marking System$725K
Aug 2018Federal grantDefense · Phase I · Through-Lens Fiducial Marking System$150K
Oct 2017Federal contractDefense · Solid Immersion Lenses For A Scanning Optical Microscope For The Weapons Development And Integration Directorate.$41K

Show 11 earlier federal awards

Aug 2017Federal contractDefense · The Requested Action Is For The Acquisition Of A Gimbal Plate Kit, Manufactured By Checkpoint Technologies Llc (cage 3C3K4) For Its Infrascan 400TDM Scanning Optical Microscope, One Of Which Is Housed At Redstone Arsenal. This Kit Is Made Specifically For The Infrascan 400TDM Som, And No Other Gimbal Plate Can Be Used In This System.$88K
Mar 2017Federal contractJustice · Igf::ot::igf The Electronic Device Analysis Unit (edau) Requires A Standard Service Agreement/contract Be Put In Place With Checkpoint Technologies For The Infrascan 300TD. This Agreement Covers Standard Maintenance On The System As Well As Service Calls If Th$179K
Feb 2017Federal contractDefense · Igf::ot::igf; Purchase Infrascan 300 Inv Preventative Maintenance Service Contract.$375K
Sep 2015Federal contractDefense · Igf::ot::igf Purchase Order To Provide Approximately Nine Additional Months Of Maintenance And Repair On The Components Of The Prior Infrascan 300TDE System, And An Optional Three Years Of Maintenance And Repair On The Fully Configured Infrascan 400TDM System, Presently Installed In Building 7804, Redstone Arsenal, Al.$426K
Aug 2015Federal contractDefense · This Noncommercial Firm Fixed Price Contract, Inclusive Of Shipping Is Issued To Checkpoint Technologies Lcc For The Development And Delivery Of An Infrascan Tdm Scanning Optical Microscope (som) With Integrated Dual Beam Interferometer (dbi) From Checkpoint Technologies Llc. This Device Will Be Developed And Manufactured At The Checkpoint Facilities In San Jose, California And Will Be Installed And Maintained At Building 7804, Redstone Arsenal, Al.$1.4M
Jun 2015Federal contractJustice · ): Ceau Seeks To Upgrade The INFRASCAN300TDM By Adding A New Ingaas Emission Camera That Has Much Higher Sensitivity Than The Current Camera. To Add This Camera, A New Microscope Head Must Also Be Purchased As Well As A System Upgrade To Windows 7$370K
Sep 2014Federal contractDefense · Small Purchase Order For The Acquisition Of The Upgrade Of The Checkpoint Technologies Lcc Infrascan 300 Scanning Optical Microscope (som) With A Higher-performance Infra-red (IR) Camera, To Include One Year Of Extended Warranty Support On The Base Unmodified System$617K
Feb 2014Federal contractJustice · 0200-LICENSES$19K
Oct 2013Federal contractDefense · Igf::ct::igf 1-YEAR Maintenance Agreement For Infrascan 300TDE Scanning Optical Microscope (som)$93K
Sep 2011Federal contractDefense · Checkpoint Laboratory Instrument Upgrade Items$47K
Jun 2010Federal contractDefense · Scanning Laser Microscope System$2M

Node area is scaled to amount. Form D reports securities sold, which can differ from an announced round; filings are numbered in the order they were made.

Standing among 49 peers

Line = median

Semiconductors · Device

Federal grants#5 · top 10%
Granted patents#7 · top 14%

Cumulative measures favor older companies. Rankings describe position today, not outcome. Below the median, ranks show as a band rather than a number.

Founders and team

No founders are linked to this company yet.

Founders appear once a person is matched to the company through its own patents, grants or filings. We never infer people from social profiles.

Checked: USPTO inventors; federal award principal investigators; SEC Form D related persons · Oct 23, 2026

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What it has protected

USPTO · 7 granted of 10

Aug 16, 2016GrantedAdjustable Split-beam Optical Probing (asop)USPTOUS 9,417,281
Dec 22, 2015GrantedMulti-magnification High Sensitivity Optical System For Probing Electronic DevicesUSPTOUS 9,217,855
Nov 10, 2015GrantedOptical Probe System Having Accurate Positional And Orientational Adjustments For Multiple Optical ObjectivesUSPTOUS 9,182,580

Show all 10 patent records

Adjustable Split-beam Optical Probing (asop)Aug 16, 2016 · US 9,417,281Granted
Multi-magnification High Sensitivity Optical System For Probing Electronic DevicesDec 22, 2015 · US 9,217,855Granted
Optical Probe System Having Accurate Positional And Orientational Adjustments For Multiple Optical ObjectivesNov 10, 2015 · US 9,182,580Granted
Remotely Aligned Wafer Probe Station For Semiconductor Optical Analysis SystemsAug 6, 2015 · Application 14173722Pending
Microscope With Detector Stop MatchingJun 4, 2015 · Application 14094547Pending
Multi-resolution Optical Probing System Having Reliable Temperature Control And Mechanical IsolationMay 12, 2015 · US 9,030,658Granted
Probing Circuit Features In SUB-32 Nm Semiconductor Integrated CircuitMay 5, 2015 · US 9,025,147Granted
Method, Apparatus, And Computer Readable Medium For Correcting An Image By Performing Filtering FunctionsApr 16, 2015 · Application 14055816Pending
Optical Probing System Having Reliable Temperature ControlOct 28, 2014 · US 8,873,032Granted
Probing Circuit Features In SUB-32 Nm Semiconductor Integrated CircuitJun 10, 2014 · US 8,749,784Granted

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Sources

Federal grants from SBIR/STTR, NIH, NSF and DoD records. Federal contracts from USAspending.gov. Private capital from SEC Form D. Patents from USPTO. Publications from OpenAlex. Regulatory activity from the Federal Register. Press matched on company name.

How to read this page

Figures show associations in public records, not causes or predictions. Nothing here is investment advice. An em-dash means no record was found under this company's name, not that none exists.

Data freshness

SEC Form D filings through Oct 23, 2026. SBIR and STTR awards through Oct 21, 2026.