FemtoMetrix, Inc.
Optical metrology system using patented Harmonic series technology to detect surface and buried defects in semiconductor wafers
- Sector
- Semiconductors
- Headquarters
- IRVINE, CA
- Founded
- 2014
- Latest Form D
- $700K, Jul 2019
- Total capital
- $6M
- Federal grants
- None on recordNo awards found in SBIR/STTR, NIH, NSF or DoD records.
- Private capital raised
- $6M
- 2 Form D · last Jul 2019
- 87 months since last filing
- Federal contracts
- None on recordNo federal contract awards found.
- Granted patents
- 21
- 19 pending · first 2019
- Rank in peer group#1 of 13
Capital timeline
Latest events
- Private capital raisedForm D · SEC · 2nd filing$700K
- Private capital raisedForm D · SEC · 1st filing$5.3M
Node area is scaled to amount. Form D reports securities sold, which can differ from an announced round; filings are numbered in the order they were made.
Standing among 13 peers
Line = medianSemiconductors · Instrument
- Granted patents#1 · top 8%
Cumulative measures favor older companies. Rankings describe position today, not outcome. Below the median, ranks show as a band rather than a number.
Founders and team
From SEC Form D filings- Alon RaphaelExecutive Officer, DirectorNamed in SEC Form D filings
- BRUCE FREYMANDirectorNamed in SEC Form D filings
- Dong-Su KimDirectorNamed in SEC Form D filings
- ISRAEL NIVDirectorNamed in SEC Form D filings
- John ChangalaExecutive OfficerNamed in SEC Form D filings
- SUNG HOON YANGDirectorNamed in SEC Form D filings
Show all 8 people
- Tom RolfesDirectorNamed in SEC Form D filings
- TYLER RUBINExecutive Officer, DirectorNamed in SEC Form D filings
What it has protected
USPTO · 21 granted of 40- GrantedField-biased Nonlinear Optical Metrology Using Corona Discharge SourceUSPTOUS 12,601,778
- GrantedMethod And Apparatus For Non-invasive, Non-intrusive, And Un-grounded, Simultaneous Corona Deposition And Shg MeasurementsUSPTOUS 12,562,333
- GrantedSecond-harmonic Generation For Critical Dimensional MetrologyUSPTOUS 12,553,708
Show all 40 patent records
- Field-biased Nonlinear Optical Metrology Using Corona Discharge SourceApr 14, 2026 · US 12,601,778Granted
- Method And Apparatus For Non-invasive, Non-intrusive, And Un-grounded, Simultaneous Corona Deposition And Shg MeasurementsFeb 24, 2026 · US 12,562,333Granted
- Second-harmonic Generation For Critical Dimensional MetrologyFeb 17, 2026 · US 12,553,708Granted
- Surface Sensing Systems and Methods for Imaging a Scanned Surface of a Sample Via Sum-Frequency Vibrational SpectroscopyDec 30, 2025 · US 12,510,350Granted
- Nonlinear Optical Stokes EllipsometersJul 10, 2025 · Application 18884050Pending
- Wafer Metrology TechnologiesMay 15, 2025 · Application 19023118Pending
- Systems For Parsing Material Properties From Within Shg SignalsMar 20, 2025 · Application 18641170Pending
- Wafer Metrology TechnologiesMar 4, 2025 · US 12,241,924Granted
- Systems And Methods For Determining Characteristics Of Semiconductor DevicesDec 3, 2024 · US 12,158,492Granted
- Systems For Parsing Material Properties From Within Shg SignalsMay 21, 2024 · US 11,988,611Granted
- Second Harmonic Generation (shg) Optical Inspection System DesignsApr 2, 2024 · US 11,946,863Granted
- Apparatus And Method Of Increasing Precision Control Of Charge Deposition Onto A Semiconductor Wafer SubstrateMar 21, 2024 · Application 18350250Pending
- Method And Apparatus For Separation Of The Second Harmonic Generation Components, Through Variation In The Input Probing Laser PolarizationMar 14, 2024 · Application 18462208Pending
- Method And Apparatus For Main Detector Synchronization Of Optically Based Second Harmonic Generation MeasurementsMar 14, 2024 · Application 18462073Pending
- Dimensional Metrology Using Non-linear OpticsMar 7, 2024 · Application 18335485Pending
- Method And Apparatus For Non-invasive Semiconductor Technique For Measuring Dielectric/semiconductor Interface Trap Density Using Scanning Electron Microscope ChargingFeb 29, 2024 · Application 18350643Pending
- Pump And Probe Type Second Harmonic Generation MetrologyNov 21, 2023 · US 11,821,911Granted
- Surface Sensing Systems and Methods for Imaging a Scanned Surface of a Sample Via Sum-Frequency Vibrational SpectroscopyNov 7, 2023 · US 11,808,563Granted
- Surface Sensing Systems And Methods For Imaging A Scanned Surface Of A Sample Via Sum-frequency Vibrational SpectroscopyOct 18, 2022 · US 11,473,903Granted
- Field-biased Second Harmonic Generation MetrologyAug 16, 2022 · US 11,415,617Granted
- Wafer Metrology TechnologiesApr 5, 2022 · US 11,293,965Granted
- Systems For Parsing Material Properties From Within Shg SignalsDec 14, 2021 · US 11,199,507Granted
- Pump And Probe Type Second Harmonic Generation MetrologyOct 19, 2021 · US 11,150,287Granted
- Surface Sensing Systems And Methods For Imaging A Scanned Surface Of A Sample Via Sum-frequency Vibrational SpectroscopyFeb 23, 2021 · US 10,928,188Granted
- Field-biased Second Harmonic Generation MetrologyMay 26, 2020 · US 10,663,504Granted
- Pump And Probe Type Second Harmonic Generation MetrologyApr 7, 2020 · US 10,613,131Granted
- Wafer Metrology TechnologiesMar 17, 2020 · US 10,591,525Granted
- Systems For Parsing Material Properties From Within Shg SignalsFeb 4, 2020 · US 10,551,325Granted
- Surface Sensing Systems And Methods For Imaging A Scanned Surface Of A Sample Via Sum-frequency Vibrational SpectroscopyApr 30, 2019 · US 10,274,310Granted
- Charge Decay Measurement Systems And MethodsOct 11, 2018 · Application 15880308Pending
- Pump And Probe Type Second Harmonic Generation MetrologyNov 19, 2015 · Application 14690179Pending
- Field-biased Second Harmonic Generation MetrologyNov 19, 2015 · Application 14690251Pending
- Wafer Metrology TechonologiesNov 19, 2015 · Application 14690279Pending
- Charge Decay Measurement Systems And MethodsNov 19, 2015 · Application 14690256Pending
- Second-harmonic Generation For Critical Dimensional MetrologyApplication 63187868Pending
- Method And Apparatus For Non-invasive Semiconductor Technique For Measuring Dielectric/semiconductor Interface Trap Density Using Scanning Electron Microscope ChargingApplication PCTUS2023069967Pending
- Apparatus And Method Of Increasing Precision Control Of Charge Deposition Onto A Semiconductor Wafer SubstrateApplication PCTUS2023069955Pending
- Method And Apparatus For Non-invasive, Non-intrusive, And Un-grounded, Simultaneous Corona Deposition And Shg MeasurementsApplication PCTUS2023069948Pending
- Method And Apparatus For Separation Of The Second Harmonic Generation Components, Through Variation In The Input Probing Laser PolarizationApplication PCTUS2023073482Pending
- Method And Apparatus For Main Detector Synchronization Of Optically Based Second Harmonic Generation MeasurementsApplication PCTUS2023073564Pending
Related companies, and why
- DORNERWORKS, LTD.Similar federal contract value in Semiconductors · null in contracts
- I2IC CORPORATION, INC.Similar federal contract value in Semiconductors · null in contracts
- Thin Film Technology CorpSimilar federal contract value in Semiconductors · null in contracts
- ENCRYPTOR INCSimilar federal contract value in Semiconductors · null in contracts
- AUTOSCOPE TECHNOLOGIES CORPSimilar federal contract value in Semiconductors · null in contracts
- Accelsius Holdings LLCSimilar federal contract value in Semiconductors · null in contracts
Sources
Federal grants from SBIR/STTR, NIH, NSF and DoD records. Federal contracts from USAspending.gov. Private capital from SEC Form D. Patents from USPTO. Publications from OpenAlex. Regulatory activity from the Federal Register. Press matched on company name.
How to read this page
Figures show associations in public records, not causes or predictions. Nothing here is investment advice. An em-dash means no record was found under this company's name, not that none exists.
Data freshness
SEC Form D filings through . SBIR and STTR awards through .